January, 2009:
TTZH started the year with participation at 3D Days in Oldenburg on 28-29 January 2009. The outstanding techniques for 3D topography analysis demonstrated at TTZH booth, is made in Besançon in France, and it is very useful not only for standard measurements, but also for many unconventional applications, like architecture, archeology, criminal investigation technique and more. The visitors have got a possibility to see both laboratory instrument and NJ Portable, applicable for the field measurements.
The picture shows the moment of processing the results of surface measurements by Mrs. Anne Calvez of nanoJura, using the powerful software NJ nanoMap®.
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